The 64th SASJ Meeting（2025.7.17-18）

The first day： July 17(Thu), 2025

• 12:30 ～ 13:00Participant Registration
• 13:00 ～ 13:10Opening Remarks and Guidelines for Online Participation
  H. Ito
• 'Special Session for the 30th Anniversary of the Surface Analysis Society of Japan :　Advances and Perspectives on Electron Scattering for Practical Surface Analysis
  • 13:10 ～ 13:50"Surface analysis and electron scattering: review of the past, present trends and future perspective"
    Prof. W. S. M. Werner（Vienna University of Technology）
  • 13:50 ～ 14:30"The Reverse Monte Carlo Method to Derive Optical Dielectric Function Data"
    Prof. Z. J. Ding（University of Science and Technology of China）
  • 14:30 ～ 15:10"Correlated Electron-Matter Interactions: From Inelastic Scattering to Beam Focusing via Rotationally Structured Crystals"
    Dr. B. Da（National Institute for Materials Science）
• 15:10 ～ 15:30- Break-
• 15:30 ～ 16:10"Progress and Challenges in IMFP Calculations for Practical Surface Analysis"
  Dr. S. Tanuma（National Institute for Materials Science）
• 16:10 ～ 16:50"Low-energy electron inelastic mean free path"
  Dr. H. T. Nguyen-Troung（Van Lang University）
• 16:50 ～ 17:30"Elastic electron scattering effects in applications of electron spectroscopies: Practical approach for quantification"
  Prof. A. Jablonski（Polish Academy of Sciences）
• 17:30 ～ 17:35End-of-Day Notice
• 17:35 ～ 18:30Transition to Reception Venue
• 18:30 ～ 20:30Reception

The second day： July 18(Fri), 2025

• 9:30 ～ 10:00Participant Registration
• 'KoSSA-SASJ exchange event
  • 10:00 ～ 10:40"In-situ graphene liquid cell electron microscopy (Tentative)"
    Prof. Jong Min Yuk,（Korea Advanced Institute of Science and Technology, Korea）
  • 10:40 ～ 11:20"Convergent Nanometrology Approaches for Advanced Nanomaterial Surface Characterization"
    Dr. Sang-Joon Cho (Park Systems Corp.)
• 11:20 ～ 13:00-Lunch -(Lunch will not be provided. Please make your own arrangements.）
• 'Invited Talk
  • 13:00 ～ 13:40"Realization of soft X-ray photoelectron spectroscopy at the real ambient pressure"
    Prof. Iwao Matsuda(University of Tokyo）
• 'General Presentations
  • 13:40 ～ 14:20"Plasmon Contribution to X-ray Photoelectron Spectroscopy (XPS) Background: Modified Shirley Baseline Formula"
    Dr. Abbas Alshehabi (Bahrain Polytechnic)
• 14:20 ～ 14:40- Break-
• 'Introduction of the New Organizational Structure and Future Policy of SASJ
  • 14:40 ～ 15:00"Overview of the Surface Analysis Society of Japan (SASJ)"
    Prof. Hisao Makino（Kochi University of Technology）
  • 15:00 ～ 15:10"Lecture Committee"
    Hiroto Itoh(KONICA MINOLTA,Inc.)
  • 15:10 ～ 15:20"Editorial Committee"
    Noriaki Sanada(ULVAC-PHI,Inc.）
  • 15:20 ～ 15:30"Standardization Committee"
    Shinya Otomo(Furukawa Electric Co., Ltd.)
• 15:30 ～ 15:40General Announcements
  H. Ito
• 15:40 ～ 15:45Closing Remarks
  Prof. H. Makino

The schedule and order of presentations are subject to change.
All times are in Japan Standard Time (JST).