The best poster presenter will be awarded the Powell Prize by voting among all the participants. The Powell Prize has been granted annually since 1995 in both international and domestic PSAs.

List of Powell Prize Winners
2009 (Domestic PSA-09)
T. Ogiwara NIMS	Auger Depth Profiling Analysis Using an Inclined Holder
2008 (Domestic PSA-08)
M. Takano Panasonic Electronic Devices	Evaluation of the Ni Diffusion to the Surface of Au Platnig for Soldering Process Control
2007 (International PSA-07)
A. Alkafri Nagoya Institute of Technology	Thermionic Emission Characteristics by CMA for the Energy Calibration in AES and New Spectra
2006 (Domestic PSA-06)
Y. Mori NGK Insulators	The Study of Surface Degradation on Silicon Oxide during Electron Irradiation
2005 (Domestic PSA-05)
S. Fukushima NIMS	Observation of the Ultrasoft X-Ray Spectra by the Electron Beam Exciting Ultrasoft X-Ray Analyzer
2004 (International PSA-04)
W. Okawa TDK	Application of High-Resolution Rutherford Backscattering Spectroscopy for Process Control of Data Storage and Thin Film Technology Components
2003 (Domestic PSA-03)
Y. Abe Mitsubishi Chemical Group Science and Technology Research Center, Inc.	Chemical Structure Changes in TOPO Capped CdSe Nanocrystals Thin Films by Comparable ToF-SIMS and XPS Study
2002 (Domestic PSA-02)
T. Kimura NIMS	Development of a Submicron Analysis Wavelength Dispersive(WDS) EPMA with a Thermal Field Emission (TFE) Type Electron Gun
2001 (International PSA-01)
K. Yanagiuchi TDK	A Practical Procedure for Surface Protection of a Bulk Specimen in the Air
2000 (Domestic PSA-00)
T. Sato Tohoku Univ.	Temperature Measurement of Specimen in XPS Analysis
1999 (Domestic PSA-99)
S. Kudo JEOL	Work Function Measurements using Scanning Auger Microscope
1998 (International PSA-98)
M. Suzuki NTT-AT	Technical Proposal for Measurement of Sputtered Depth Using a Mesh - Especially for Auger Depth Profiling -
1997 (Domestic PSA-97)
T. Oyama Murata Manufacturing	Neutralization Method of Diifferential Charging on Non-monochromatized X-ray Photoelectron Spectroscopy Analysis
1996 (Domestic PSA-96)
H. Matsuta Tohoku Univ.	Background Subtraction from First Transition Metal 2p XPS Spectra by Deconvolution using XPS Spectra of Other Element being in Sample
1995 (Domestic PSA-95)
A. Aso Japan Energy ARC	X-ray Photoelectron Analyses of the Water Adsorbed on Polyethylene Containing Sodium Alkene Sulfonate -Estimation of the Water Thickness on the Polyethylene-