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Plenary Talk
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R. Shimizu
(International Institute for Advanced Studies, Japan) |
45 years in Monte Carlo simulation for microbeam analysis -a personal retrospective review-
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D. Baer
(Pacific Northwest National Laboratory, USA) |
Surface characterization of nanoparticles: critical needs and significant challenges |
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Standardization
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I. Gilmore
(National Physical Laboratory, UK) |
The development of a standards base for static SIMS –now and the future- |
K. J. Kim
(Korean Research Institute of Standards and Science, Korea) |
Improvement of uncertainty in surface analysis |
C. J. Powell
(National Institute for Standards and Technology, USA) |
Surface sensitivity of AES and XPS |
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Theory and simulation
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Z. J. Ding
(University of Science and Technology of China, China) |
Simulation of particle scattering from solid surfaces by using Bohmian quantum trajectory method |
S. Tougaard
(University of Southern Denmark, Denmark) |
Nano-structure information from XPS; automated data analysis and 3D-imaging |
W. S. M. Werner
(Vienna University of Technology, Austria) |
Progress in quantitative interpretation of electron spectra for surface and nanostructure analysis |
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Data analysis and treatment
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J. Castle
(University of Surrey, UK) |
Auto interpretation of XP spectra |
A. Jablonski
(Polish Academy of Sciences, Poland) |
The backscattering correction factor revisited |
B. J. Tyler
(University of the West Indies, Republic of Trinidad and Tobago) |
Critical issues in multivariate analysis of ToF-SIMS spectra, images and depth profiles |
H. Yoshikawa
(National Institute for Materials Science, Japan) |
Energy loss functions and optical constants of semiconductors determined by factor analysis of reflection electron energy loss spectra |
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Novel techniques and instrumentation
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J. Matsuo
(Kyoto University, Japan) |
Novel primary ion beams for bio-SIMS |
J. W. Park
(Postech Biotech R&D Center, Korea) |
Force-based AFM for biomarker detection |
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Application I (semiconductor, metal, ceramics, composite, etc.)
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J. Hemminger
(University of California at Irvine, USA) |
Ambient pressure XPS and liquid-jet XPS experiments: Probing the liquid/vapor interface of aqueous solutions |
L. P. H. Jeurgens
(Max-Planck-Institut fur Metallforschung, Germany) |
In-situ, real-time investigations of the growth of ultrathin oxide films |
K. Kobayashi
(National Institute for Materials Science, Japan) |
Application of hard x-ray photoelectron spectroscopy as a bulk sensitive probe |
P. Lejeck
(Academy of Sciences of the Czech Republic, Czech Republic) |
Application of quantitative AES to interfacial segregation |
K. Yanagiuchi
(TDK, Japan) |
Study of the spin polarization of non-magnetic materials inserted into ferromagnetic materials by X-ray magnetic circular dichroism |
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Application II (bio, organic, and energy materials)
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D. Castner
(University of Washington, USA) |
Surface characterization of functionalized nanoparticles |
T. G. Lee
(Korean Research Institute of Standards and Science, Korea) |
Label-free nano-surface analyses of organic- and bio-conjugated biochips and nanoparticles |
Y. C. Ling
(National Tsing Hua University, Taiwan) |
ToF-SIMS imaging of cellular changes induced by ZnO-containing nanomaterials |
C. Mahoney
(National Institute for Standards and Technology, USA) |
Surface and in-depth characterization of polymer-based drug delivery devices with cluster Secondary Ion Mass Spectrometry |
R. Reedy
(National Renewable Energy Laboratory, USA) |
The application of SIMS in photovoltaic research and development at NREL |
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Korea-Japan-China special session
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A. Alkafri
(1National Standards and Calibration Laboratory, Syria) |
Thermionic emission for the energy calibration and transmission measurements for the CMA in the absolute AES |
T. Ogiwara
(National Institute for Materials Science, Japan) |
High depth resolution Auger depth profiling using a 85-deg-high-angle inclined holder |
M. Takano
(Panasonic Electronic Devices Co.,Ltd., Japan) |
Evaluation of the Ni diffusion to the surface of Au plating for soldering process control |
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