Invited Speaker
| SESSION : Plenary | |
| Prof. H. Jörg Mathieu EPFL- STI - Materials Science (Switzerland) | |
| "Chemical surface analysis: which is the right method for your problem ?" | |
| SESSION : Plenary | |
| Dr. K. Goto AIST (Japan) | |
| "Absolute AES for the DATA Base" | |
| SESSION : Powell Prize 10th anniversary | |
| Dr. Cedric J. Powell NIST (USA) | |
| "Growth and Trends in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy for Surface Analysis" | |
| SESSION : Powell Prize 10th anniversary | |
| Dr. Matin P. Seah NPL (UK) | |
| "Sputtering and Cluster Primary Ions" | |
| SESSION : Powell Prize 10th anniversary | |
| Dr. A. Jablonski Inst. Phys. Chem. (Poland) | |
| "Disentagling Intricacies of Electron Transport in Solids" | |
| SESSION : Theory/Simulation | |
| Prof. T. Fujikawa Chiba Univ. (Japan) | |
| SESSION : Theory/Simulation | |
| Prof. H.-J. Kang Chungbuk Univ. (Korea) | |
| SESSION : Standardization | |
| Dr. I. Gilmore NPL (UK) | |
| "Development of a standards base for static SIMS" | |
| SESSION : Standardization | |
| Dr. H.-S. Lee Korea Basic Science Institute (Korea) | |
| "Standardization on Scanning Probe Microscopy" | |
| SESSION : Standardization | |
| Dr. Wolfgang Unger BAM (Germany) | |
| "BAM reference materials for surface and nano analysis: Status and future projects" | |
| SESSION : Data Analysis/Treatment | |
| Prof. James Castle University of Surrey (UK) | |
| "The Development of a Rule-Set for Automatic Interpretation of XPS Spectra" | |
| SESSION : Data Analysis/Treatment | |
| Prof. Sven Tougaard Univ. Southern Denmark (Denmark) | |
| "Electron transport models for quantitative analysis of morphology and electronic properties of surface nano-structures" | |
| SESSION : Data Analysis/Treatment | |
| Prof. Wolfgang S. M. Werner Technical Univ. of Vienna (Austria) | |
| "Electron scattering data extracted from reflection measurements applied to quantitative analysis of XPS and AES spectra" | |
| SESSION : Application | |
| Prof. John T. Grant Univ. Dayton (USA) | |
| "XPS: Issues with Data Acquisition and Data Processing" | |
| SESSION : Application | |
|
Dr. László Kövér Institute of Nuclear Research of Hungarian Academy of Sciences (ATOMKI) (Hungary) |
|
| "Surface and Interface Analysis using High Energy Electron Spectroscopy" | |
| SESSION : Application | |
| Dr. C. Bureau alchimer s.a. (France) | |
| "Surface analysis as a manufacturing quality control: nanotechnologies at work in the biomedical and semiconductor industries" | |
| SESSION : Application | |
| Dr. Y.-S. Jung SAIT (Korea) | |
| SESSION : Application | |
| Dr. Sally L. McArthur Univ. Sheffield (UK) | |
| "Unravelling bio interfacial interactions" | |
| SESSION : Application | |
| Dr. William Stickle Hewlett-Packard Co (USA) | |
| "Applications of Surface Analysis in Electronics Materials Processing" | |