Invited Speaker
SESSION : Plenary | |
Prof. H. Jörg Mathieu EPFL- STI - Materials Science (Switzerland) | |
"Chemical surface analysis: which is the right method for your problem ?" |
SESSION : Plenary | |
Dr. K. Goto AIST (Japan) | |
"Absolute AES for the DATA Base" |
SESSION : Powell Prize 10th anniversary | |
Dr. Cedric J. Powell NIST (USA) | |
"Growth and Trends in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy for Surface Analysis" |
SESSION : Powell Prize 10th anniversary | |
Dr. Matin P. Seah NPL (UK) | |
"Sputtering and Cluster Primary Ions" |
SESSION : Powell Prize 10th anniversary | |
Dr. A. Jablonski Inst. Phys. Chem. (Poland) | |
"Disentagling Intricacies of Electron Transport in Solids" |
SESSION : Theory/Simulation | |
Prof. T. Fujikawa Chiba Univ. (Japan) | |
SESSION : Theory/Simulation | |
Prof. H.-J. Kang Chungbuk Univ. (Korea) | |
SESSION : Standardization | |
Dr. I. Gilmore NPL (UK) | |
"Development of a standards base for static SIMS" |
SESSION : Standardization | |
Dr. H.-S. Lee Korea Basic Science Institute (Korea) | |
"Standardization on Scanning Probe Microscopy" |
SESSION : Standardization | |
Dr. Wolfgang Unger BAM (Germany) | |
"BAM reference materials for surface and nano analysis: Status and future projects" |
SESSION : Data Analysis/Treatment | |
Prof. James Castle University of Surrey (UK) | |
"The Development of a Rule-Set for Automatic Interpretation of XPS Spectra" |
SESSION : Data Analysis/Treatment | |
Prof. Sven Tougaard Univ. Southern Denmark (Denmark) | |
"Electron transport models for quantitative analysis of morphology and electronic properties of surface nano-structures" |
SESSION : Data Analysis/Treatment | |
Prof. Wolfgang S. M. Werner Technical Univ. of Vienna (Austria) | |
"Electron scattering data extracted from reflection measurements applied to quantitative analysis of XPS and AES spectra" |
SESSION : Application | |
Prof. John T. Grant Univ. Dayton (USA) | |
"XPS: Issues with Data Acquisition and Data Processing" |
SESSION : Application | |
Dr. László Kövér Institute of Nuclear Research of Hungarian Academy of Sciences (ATOMKI) (Hungary) |
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"Surface and Interface Analysis using High Energy Electron Spectroscopy" |
SESSION : Application | |
Dr. C. Bureau alchimer s.a. (France) | |
"Surface analysis as a manufacturing quality control: nanotechnologies at work in the biomedical and semiconductor industries" |
SESSION : Application | |
Dr. Y.-S. Jung SAIT (Korea) | |
SESSION : Application | |
Dr. Sally L. McArthur Univ. Sheffield (UK) | |
"Unravelling bio interfacial interactions" |
SESSION : Application | |
Dr. William Stickle Hewlett-Packard Co (USA) | |
"Applications of Surface Analysis in Electronics Materials Processing" |